Is given a some statistics of use of stress I/O by means of test applications (see attachment) on some platforms.

Where are available two applications: "stresswriter" and "stressreader". A "stresswriter" transmits data through the serial port, and "stressreader" reads data from the serial port. In this example these applications shall work in couple via the null-modem cable. It reaches the maximum use of throughput and channel loading.

The maximum loading of CPU is caused by the "reader" example. Besides, this loading depends on the driver of the serial port.

Please, provide statistics of results in comments below.